Used AMAT / APPLIED MATERIALS Verity #9038493 for sale
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ID: 9038493
Scanning electron microscope
Largest load ampere rating: 8 A
Full load current: 10 A
Interrupt current: 10,000 Amps
120/208 VAC, 3 Ph, 50/60 Hz, 5 wires
2005 vintage.
AMAT / APPLIED MATERIALS Verity is a scanning electron microscope (SEM) designed to study the structure and composition of many different samples. It is particularly useful for imaging nanoscale features with a resolution as low as 0.5 nm. The microscope is based on an electron beam column composed of several components including an electron gun, electron lenses, and a secondary electron detector. The state-of-the-art electron gun consists of a heated cathode tip emitting electrons which is focused by a large electro-static lens and a small recording lens. These lenses can be adjusted to create an electron beam with the desired properties to be used for imaging. The column is equipped with a wide variety of imaging modes such as secondary electrons, secondary ions, and other imaging modalities. In addition, the microscope is capable of imaging a sample in different analytical states such as inert gas atomization, electron-beam induced deposition, photo emission, electron back scattered diffraction, or chemical analysis that allows for improved image contrast and image information. Furthermore, imaging at different angles is possible using the tilt-stage. The tilt-stage enables different angles of incoming radiation, which allows for the analysis of three-dimensional structures and surface morphologies. The secondary electron detector is one of the most important components of the scanning electron microscope. It consists of four detector segments: the top left and top-right detectors for detecting back-scattered secondary electrons, the bottom row for imaging the secondary electrons, and the bottom-right for detecting reflected beam electrons. Each segment has its own detector and amplifier, which together allow for enhanced signal to noise ratio and improved resolution. Once an image is obtained, the microscope is capable of further processing the collected data to better enhance the quality of the image. This can include additional noise-filtering techniques and image-enhancement techniques that are available within the microscope's software. Finally, AMAT Verity Scanning Electron Microscope benefits from a USB compatible interface that enables the user to transfer data to and from computers and software. This allows the user to leverage the power of the microscope with modern computing platforms and the utilization of enhanced software features. This increases the versatility of the microscope and the ability to interact with data collected.
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