Used AMAT / APPLIED MATERIALS VeritySEM 2 #9259630 for sale

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ID: 9259630
Wafer Size: 12"
Critical Dimension Scanning Electron Microscope (CD-SEM), 12".
AMAT / APPLIED MATERIALS VeritySEM 2 is a scanning electron microscope (SEM) used in a wide range of applications across various industries. As a member of AMAT range of scanning and transmission electron microscopes, this SEM is capable of providing detailed imaging of a range of sample surfaces and material characteristics. AMAT VeritySEM 2 has a range of features and settings which enable users to acquire high resolution imaging and analysis. The SEM technology utilizes an electron beam which is directed onto a sample surface, providing detailed images of surface morphology, structures and crystalline materials. The SEM also produces an automated 3D-image with minimal user input. This gives accurate information on sample features such as topography, porosity, dimensions, composition and more. APPLIED MATERIALS VERITY SEM 2 features electron beam energy of up to 30kV, and magnifications of up to 200,000X. It has a secondary electron detector, a backscattered electron detector and an optional X-ray energy dispersive detector for elemental analysis. It also features a digital imaging system to capture high resolution images of samples. VERITY SEM 2 is made from rugged components for durability and allows users to adjust settings to quickly achieve optimum performance for their application. It is designed to minimize user error, with ergonomic knobs and intuitive navigational panels. The SEM is suitable for operation in a wide range of environments, so it can be used in a variety of industrial and research applications. It is compatible with many other imaging systems, making it easy to integrate into custom application setups. AMAT / APPLIED MATERIALS VERITY SEM 2 is an excellent tool for imaging and surface analysis. It is designed to provide reliable performance and accurate imaging in a range of industrial and research applications. It is an ideal choice for those seeking a versatile, high-performance scanning electron microscope.
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