Used AMAT / APPLIED MATERIALS VeritySEM 2 #9287518 for sale

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AMAT / APPLIED MATERIALS VeritySEM 2
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ID: 9287518
Critical Dimension Scanning Electron Microscope (CD SEM).
AMAT / APPLIED MATERIALS VeritySEM 2 is a scanning electron microscope (SEM) used for a variety of high-resolution imaging and compositional analysis applications. It has a resolution of up to 2 nm, and is capable of producing high-contrast, low-noise images with excellent depth of field. AMAT VeritySEM 2 is suitable for imaging both non-conductive and conductive samples, making it a versatile tool for a wide array of structural and morphological characterization. APPLIED MATERIALS VERITY SEM 2 operates on a single column platform, allowing for maximum flexibility in sample preparations and imaging. The high-performance electron column is equipped with an in-lens channel electron multiplier detector for improved image quality and signal-to-noise ratio. Additionally, the instrument features a differential pumping system which creates an ultra-high vacuum environment for imaging, allowing sample analysis without the interference of external contaminants. VERITY SEM 2 also offers variable analytical capabilities such as backscattered electron imaging, energy dispersive spectroscopy (EDS), and cathodo-luminescence (CL) analysis. Backscattered electron imaging offers increased contrast for non-conductive samples by detecting secondary electrons emitted from an incident beam of electrons. The EDS detector enables elemental mapping with a maximum resolution of 1 micron. CL imaging is useful for imaging sample luminescence in materials such as phosphorus, sulfur, and silica. Finally, VeritySEM 2 includes a robust software suite, allowing users to edit and refine images, generate 3D reconstructions, and export images and analysis data. This software is user-friendly and includes a wide range of features for manipulating, analyzing and annotating SEM images. In summary, AMAT VERITY SEM 2 is an ideal tool for imaging and elemental analysis of a wide range of samples, offering excellent resolution, great signal-to-noise ratio, and a high level of flexibility. Its advanced software capabilities allow users to easily perform detailed analysis and refine images and data.
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