Used AMAT / APPLIED MATERIALS VeritySEM 4i #9371906 for sale

AMAT / APPLIED MATERIALS VeritySEM 4i
ID: 9371906
Wafer Size: 12"
Critical Dimension Scanning Electron Microscope (CD-SEM).
AMAT / APPLIED MATERIALS VeritySEM 4i is a scanning electron microscope (SEM) designed to provide the highest performance in imaging and analysis applications. This model features an integrated equipment offering high-resolution imaging capabilities, excellent signal-to-noise ratio and low operating cost. AMAT VeritySEM 4i is suitable for metallography, crystallography, electrical characterization, and materials analysis. APPLIED MATERIALS VeritySEM 4i is equipped with an advanced electron optics column designed to provide exceptionally high performance. This microscope is fitted with a dual objective gun that enables its use for both secondary and backscattered electron imaging. The dual-objective gun also allows more imaging modes and imaging capabilities, such as reflected and transparent mode imaging. VeritySEM 4i also features a high-resolution digital imaging system that can capture detailed images quickly. This microscope is also equipped with a combination of both manual and computer-assisted stages. The manual stage offers the user maximum control over the sample positioning, while the computer-assisted technology provides repeatable, consistent results. a large 6-inch vacuum chamber is also incorporated into AMAT / APPLIED MATERIALS VeritySEM 4i, maximizing the amount of space available to work with the sample. This allows for sample sizes from 125 mm to over 370 mm. AMAT VeritySEM 4i also features a non-destructive analysis unit, providing researchers with the ability to obtain a range of information about their sample without damaging it. This machine produces highly accurate information about the microstructure of a sample, allowing for a more in-depth understanding of its properties. APPLIED MATERIALS VeritySEM 4i is an ideal choice for researchers who demand high accuracy without compromising performance or quality. The combination of incorporated scanning electron microscopy technology, advanced optics, and computer-assisted imaging systems make this instrument a top choice for laboratories seeking the highest precision in microscopic analysis.
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