Used AMAT / APPLIED MATERIALS VeritySEM #9093773 for sale

AMAT / APPLIED MATERIALS VeritySEM is a high-performance scanning electron microscope (SEM) that combines advanced capabilities to deliver high-resolution imaging, materials characterization and fail-analysis of the most critical semiconductor device structures. With its advanced electron optics and ultra-high vacuum technology, AMAT VeritySEM enables the production of exceptional high-quality images for both materials characterization and failure analysis. For materials characterization and failure analysis, APPLIED MATERIALS VeritySEM was designed to offer superior spatial resolution and productivity. It utilizes a highly efficient electron column with an in-lens field electrostatic electron gun, which ensures larger depth of field and stable imaging at low voltages. The optics also feature advanced electron optics and an energy filter that enables superior beam coherence. This makes the instrument ideal for providing high-fidelity, high-resolution imaging needed for advanced failure analysis and materials characterizations. VeritySEM also comes equipped with a range of advanced tools and accessories for advanced analysis. The equipment includes an integrated shape measurement module for nanometer scale dimensional measurements, transportable cryogenic stages for ultra-low temperature imaging, and an EDS (energy dispersive spectroscopy) module. This allows the system to measure composition and thickness of individual layers, plus a range of other parameters. AMAT / APPLIED MATERIALS VeritySEM also provides advanced features for automated probing and measurement. Advanced automated wafer and package probing automation tools allow users to quickly and accurately identify defects within the semiconductor devices. The unit also includes an automated thermal imaging machine, designed to further streamline failure analysis projects. AMAT VeritySEM features an intuitive user interface, making it easy to use. The tool also offers a range of data management tools to monitor and track failure analysis projects. Additionally, the powerful software package provides automated image-processing algorithms for maximum results. Overall, APPLIED MATERIALS VeritySEM is a powerful and advanced scanning electron microscope for both materials characterization and failure analysis. It combines powerful electron optics, advanced imaging and analysis tools, and a comprehensive user interface for a cost-effective and streamlined solution for semiconductor device analysis. With its superior performance and precision, VeritySEM offers an excellent solution for high-resolution imaging and failure analysis.