Used AMAT / APPLIED MATERIALS VeritySEM #9206102 for sale
URL successfully copied!
Tap to zoom
AMAT / APPLIED MATERIALS VeritySEM is a scanning electron microscope (SEM) designed for high reliability and excellent flexibility. It provides users with a user friendly environment and advanced imaging capabilities. AMAT VeritySEM utilizes multiple lens magnifications and an imaging equipment that provides unparalleled resolution, allowing users to view extremely fine details. This advanced system offers a versatile range of imaging capabilities, with magnification ranging from 10x to 300kx, a large working distance (WD) of 200mm, and a broad range of working angles up to ±90°. APPLIED MATERIALS VeritySEM also features a no-clog vacuum unit which simplifies maintenance and minimizes downtime, as well as an automated specimen loader capable of handling substrate from single wafers to corn-on-the-cob. In addition to its imaging capabilities, VeritySEM utilizes a powerful computational environment which allows users to easily toggle between automated and manual control. This enables users to set up laser scanning, multiple gas detectors, and EDS (energy-dispersive spectroscopy) analysis to quickly acquire high-contrast images, quantified data, and elemental maps. AMAT / APPLIED MATERIALS VeritySEM is also capable of operating at low speeds and long scan times, making overnight reticles or wafer-scale analysis possible. For users requiring even more control over their SEM machine, AMAT VeritySEM can be coupled with an optional docking station. This station provides a network connection for multiple computers, allowing users to access the SEM tool from anywhere with an internet connection. With the additional control, users can more easily configure settings for intricate measurements and image capture. Overall, APPLIED MATERIALS VeritySEM offers advanced imaging capabilities as well as a powerful computational environment. Its versatility and ease of use make it an ideal instrument for a wide range of SEM applications, ranging from inspection and defect analysis to materials science and failure analysis.
There are no reviews yet