Used AMRAY 1200 #126383 for sale

AMRAY 1200 scanning electron microscope is a high-performance, high-resolution imaging system designed to capture images of microscopic structures, surfaces, and particles. It utilizes a field emission source and a secondary electron detector to provide high magnification images with superior clarity and detail. The microscope features a control system, cylindrical and spherical configurations, multi-beam detectors, and a versatile sample stage that allows for 3-dimensional scanning. The microscope has a field emission gun, or FEG, at its core and can be operated in either a low-voltage or high-voltage mode. The low-voltage mode provides images with higher resolution and allows for a larger field of view. The high-voltage mode produces high-magnification images and is suitable for scanning small sections of a sample. 1200 utilizes a secondary electron detector to capture images of surfaces and particles. This detector has a high-energy acceptance range and produces highly detailed images of even the smallest samples. Additionally, the microscope has a cylindrical and spherical detector configuration, allowing for the imaging of both two-dimensional and three-dimensional samples. Both detectors are equipped with multi-beam detectors for high resolution imaging. The microscope also offers a number of sample-specific control modes. For example, a tilt-tilt function can be used to acquire images of samples as they are inclined or moved towards and away from the microscope. Other control modes include auto-focus and eccentric circle scan, both of which allow for automated scanning of large samples. The microscope includes a wide variety of automated sample stages, allowing for automated scan movements and motorized tilting capabilities. This allows for three-dimensional scanning of samples, with highly detailed images and a range of magnifications. In summary, AMRAY 1200 scanning electron microscope is a versatile, high-resolution imaging instrument designed to capture detailed images of microscopic structures, surfaces, and particles. It features a field emission source, a secondary electron detector, a cylindrical and spherical configuration, multi-beam detectors, and an automated sample stage that allows for three-dimensional scanning. It is an ideal instrument for imaging a range of samples with high clarity and detail.