Used AMRAY 1830 #293657412 for sale

AMRAY 1830 scanning electron microscope (SEM) is a powerful tool for high resolution imaging and analysis of nanoscale samples. It offers a large field of view and a maximum resolution of 1.8 nm. This microscope is used for a wide variety of applications, including surface imaging, sample depth profiling, particle/surface analysis, and chemical analysis. 1830 is equipped with a high resolution secondary electron detector that gives maximum spatial resolution of 1.8 nm in circular and 0.9 nm in linear mode. It also features a large field of view of up to 500mm, making it ideal for investigating large sample areas. The SEM is also capable of imaging a wide range of sample types including single-crystals, semiconductors, dielectric materials, insulators, plastics, and metals. AMRAY 1830 utilizes digital imaging processing to reduce the noise inherent in SEM imaging, allowing for better resolution and contrast compared to other electron imaging devices. Additionally, the microscope is engineered for high-stability performance, with a computerized control system that eliminates the need for manual scanning alignment. 1830 is equipped with a variety of imaging modes, including secondary electrons (SE), backscatter electrons (BSE), and differential secondary electrons (DSE). The SE mode is used for surface and sample topography investigations, while the BSE mode can be used to identify different materials in a sample. The DSE mode allows for surface contrast imaging to produce better contrast on surfaces with chemical or topographical variations. AMRAY 1830 is also equipped with an X-ray detector for Electron Traced X-ray analysis including elemental analysis, phase analysis, and chemical bonding analysis. The X-ray detector can be used to verify and identify the composition of a sample, allowing for more accurate analysis of the sample. Overall, 1830 is a powerful scanning electron microscope (SEM) that provides high resolution imaging and sample analysis as well as phase and elemental analysis. With its large field of view, high resolution, and wide range of applications, it enables a variety of research and study applications in the field of nanoscale materials.