Used AMRAY 2030 #293595279 for sale

AMRAY 2030 is a scanning electron microscope (SEM) that is equipped with large field of view (FOV) and EDS-EDX detectors for standard imaging and acquisition of material microstructures for elemental analysis. It features high resolution imaging capabilities and FOV up to 100mm diameter at low working distances with superior depth of field (DOF). 2030 offers a wide variety of imaging tools such as variable-pressure secondary electron (VPE-SE) imaging, variable-pressure backscatter electron (VPE-BSE) imaging, variable-acceleration backscatter electron (VAB-BSE) imaging, variable-acceleration secondary electron (VAB-SE) imaging, 3D surface imaging, And fluorescence photon-induced secondary emission imaging. It has a special program called Smart Scan which enables automated image acquisition and replay in a single touch. AMRAY 2030 also includes Z-axis scanning system which allows the user to make X-Y scans within a plane and then automatically move to the next plane for required depth of view and 3D imaging of samples. The Z-axis scan stages feature Piezo Linear Motors (PLM) equipped with high-speed scanners to deliver the full range of images required for your 3D analysis. For elemental analysis 2030 offers a range of wavelength dispersive X-ray and energy dispersive spectroscopy (EDS/EDX) systems, operated from the integrated software. The EDS detector is designed to deliver high resolution analysis across the complete range of elements from boron to uranium. The automated sample holder and an optional motorized x-y stages on AMRAY 2030 allow for automated imaging workflows. The automated sample stages provide a quick and easy way to image multiple samples in sequence and the x-y motorized stages allow for fast and precise automated X-Y scanning to enhance the imaging speed and accuracy. 2030 has a vacuum chamber desiccator assembly that operates with a built-in warning system that actively monitors the performance of the chamber throughout the sample preparation and imaging process. It also has a vacuum chamber safety interlock system that automatically shuts down the instrument when the vacuum is degraded beyond the required levels. The instrument is fully automated and comes with advanced image processing software for image and element analysis. The automated features for detecting different types of defects and features, as well as advanced tracking and analysis software package make AMRAY 2030 ideal for high resolution scans and structure analysis of metals, semiconductors, and other materials.