Used AMRAY 3200C #293659826 for sale

AMRAY 3200C is a scanning electron microscope (SEM) equipped with modern features that make it an ideal enabling tool for research and development. It is capable of acquiring high resolution, high magnification analytical images and three-dimensional image analysis of a wide range of sample types. The SEM is designed for a range of scientific and industrial applications ranging from semiconductor failure analysis to ceramic characterization to aqueous corrosion. The major components of 3200C include the sample preparation chamber, main chamber, gantry, detectors, and image processing system. The main chamber houses the electron optics for generating the beam, the detector assembly for collecting images, and the stage for sample staging and alignment. The gantry contains the lens system and mechanical components for accurately focusing and driving the electron beam. The detector assembly provides fast image acquisition time and high resolution results. AMRAY 3200C includes a wide range of features such as variable beam current, selectable voltage, digital tilt control, precision positioning, and multiple image acquisition modes. The beam current is adjustable from 1mA to 40mA while the voltage is adjustable up to 30 kV. The tilt control settings are computer controlled and enable precise alignment for focus and magnification. The precision positioning of the stage allows for repeatable results. The multiple image acquisition modes include standard, high-resolution, and ultra-high-resolution. 3200C also includes advanced imaging techniques such as Back Scattered Electron (BSE) imaging, which enables three-dimensional surface imaging. The BSE imaging technique uses the larger depth of field to create high-quality images with excellent contrast for materials with a wide range of properties. The image processing system includes an automated feature recognition algorithm, which allows for automated pattern analysis of materials. AMRAY 3200C is an advanced, next-generation scanning electron microscope. It provides a wide range of features for precise sample imaging at high resolution and magnification, advanced imaging techniques, and automated image analysis. With a comprehensive range of features and capabilities, 3200C is ideal for a variety of research and development applications.