Used CAMBRIDGE EBMF 10.5 #293641894 for sale

CAMBRIDGE EBMF 10.5 is a scanning electron microscope (SEM) designed for non-destructive testing, imaging, and analysis of samples at 10.5 kV to 30 kV. It features a high resolution cold FEG column, allowing for a half-angle of less than a few 1/0, and a sample stage featuring up to 10 different sample stages. CAMBRIDGE EBMF 10.5 has an auto-intensity control system that can maintain a constant level of electron irradiance on the sample. It's built to minimize surface damage and minimize sample drift during imaging. With its 8'' x 8'' TEM field of view, it has a magnification range of up to 100,000X that can be further extended by the addition of special lenses. The electron source, being composed of a cold field emission gun, is able to produce a focused spot size of less than 1µm and can work at accelerating potentials of between 10.5 and 30kV. The SEM is able to store up to 4096x4096 resolution images of the sample using its 16-bit grayscale resolution, as well as generate video in real-time while imaging. It is also equipped with an e-beam switched grid system which can provide enhanced images allowing for sharp contrast between different areas. CAMBRIDGE EBMF 10.5 is engineered with a modular and user-friendly design, with the sample chamber and work table being separated for improved control of heat and vibrations and for easier operability when maneuvering the microscope. With its built-in safety features and intelligent sample handling capabilities, the system prevents damage to delicate samples and is built to be easy to use and maintain. Besides its imaging capabilities, it is also capable of performing non-destructive analysis and automated vacuum measurements for various material compositions for further analysis. With its advanced imaging functionality, intuitive controls, and enhanced safety features, CAMBRIDGE EBMF 10.5 is an ideal tool for both non-destructive testing as well as imaging and analysis applications.