Used CAMBRIDGE EBMF-6 #145926 for sale

ID: 145926
Wafer Size: 6"
Electron beam writing system, 6", de-installed.
CAMBRIDGE EBMF-6 Scanning Electron Microscope (SEM) is a medium-voltage SEM that is capable of analyzing a wide variety of sample materials in both academic and industrial environments. This SEM is equipped with a variable-pressure gas injection equipment, allowing samples to be analyzed under low-vacuum and even ambient conditions. EBMF-6 is capable of imaging structures down to the nanometer scale with resolutions of 1 nm for secondary electrons and 3 nm for backscattered electrons. It boasts a sensitivity of 0.25 nm/v and a small spot size of 1 nm for maximized resolution. CAMBRIDGE EBMF-6 SEM features an Everhart-Thornley detector for detecting secondary electrons, which can then be used for 3D imaging. Furthermore, the dedicated backscattered electron detector provides superior images of the sample's crystal structure. This state-of-the-art technology allows researchers to isolate the structure of a sample without anyperturbing agents or background noise. EBMF-6 also includes a digital optical system that supports a variety of image processes and image enhancements. This improves the SEM's accuracy and speed by allowing up to 360° rotation of the sample, a digital zoom of 2x, doubling image clarity and allowing fast object search within the image. The SEM also includes a Joystick operated Focus and Z-axis stage that enables sample manipulation without the need to remove and re-position the sample under the scanning electron beam. This feature speeds up the entire data acquisition process, which is an essential part of SEM studies. CAMBRIDGE EBMF-6 is easy to use, owing to its powerful yet user-friendly control unit. The software features an intuitive graphical user interface that simplifies the whole process and allows users to quickly learn how to control the SEM. All in all, EBMF-6 Scanning Electron Microscope is a reliable, powerful, and user-friendly SEM that provides excellent imaging capabilities at a small spot size and high sensitivity. Its advanced features and efficient control machine make it a great choice for academic and industrial research.
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