Used CAMBRIDGE S-120 #9079996 for sale

CAMBRIDGE S-120 Scanning Electron Microscope (SEM) is a high-resolution imaging instrument designed to provide investigators with clear and detailed microscopic images. It is capable of producing camera images as small as one nanometer (nm), in addition to topographical mapping and electron diffraction. The microscope is versatile, allowing for multiple configurations of the specimen stage, detector, and signal collection. The specimen stage is capable of carrying samples of a variety of materials, including magnetic and non-magnetic materials, as well as organic and inorganic compounds. In addition, the stage can be tilted and rotated to view the specimen from different angles. S-120 works by generating a beam of electrons, typically at an acceleration voltage of 30,000 volts (V). The electrons pass through the specimen stage and interact with the sample to form a secondary electron image. This image is imaged through a detector, which is composed of an array of solid-state electron sensing elements designed to detect the structure of the specimen. The detector has built-in software that carries out signal analysis and data processing, allowing the microscope to reconstruct images of the specimen's interior structure. In addition to imaging samples, CAMBRIDGE S-120 can also be used to analyze the surface of samples. This can be done by placing the sample on the stage and adjusting the electron beam's size and duration until it is just large enough to capture only the sample surface. Once this is done, the beam can be raster scanned across the surface of the sample in order to estimate its composition and surface topography. Finally, S-120 can also perform electron diffraction. This technique uses a beam of electrons of different energies to identify the material being observed. By adjusting the frequency of the electrons emanating from the electron gun, it is possible to identify different elements present in a sample. This feature of the SEM is useful in identifying complex structures that may not otherwise be visible. In summary, CAMBRIDGE S-120 scanning electron microscope is an advanced imaging, analysis, and characterization tool, capable of high-resolution imaging and sampling of a variety of materials. Its versatility allows for a wide range of applications, from analyzing the surface of samples to identifying elements. Additionally, its electron diffraction capabilities can be used to identfy complex structures in samples, ultimately providing researchers with a powerful tool in material science.