Used CAMBRIDGE S-90B #9079994 for sale

CAMBRIDGE S-90B is a scanning electron microscope (SEM) designed for superior imaging performance in analytical, imaging and failure analysis applications. This microscope features an impressive range of advanced technology and features that enable it to provide unprecedented visibility of samples down to 1nm scale. It has a built-in SE (secondary electron) detector and an energy dispersive X-ray (EDX) detector, which is ideal for chemical and elemental analysis. By taking advantage of variable air gap (VAG) technology, S-90B can produce superb images of both thin and thick samples with minimal sample distortion. Its highly regulated electron optics provide a wide range of light intensity settings for imaging of particles down to a few nm size. The SX1000EP semiconductor electrically pulsed ultrahigh vacuum (UPV) electron column enables images and elemental maps to be obtained rapidly, with no sampling artifacts or contaminants. This allows precise analysis of a variety of materials, from metals to organic materials, at high resolution and sensitivity. CAMBRIDGE S-90B is equipped with an intuitive Microsoft Windows-based user interface offering easy sample navigation. The Auto-Scan feature provides automated scanning of sample images with various magnifications. Automated stage control and a range of camera functions enable the acquisition of precise images with minimum operator involvement. Additional features include a Semi flexible Scanner (SFS) for imaging of curved surfaces over several angles, tilt angle scans for imaging orientation effects and Focus Raman Imaging (FRI) to analyze samples on the nanometer scale. S-90B is also equipped with a Dynamic Secondary Electron Image Enhancer (DSEE), which utilizes advanced algorithms to enhance secondary electron images from highly textured samples. CAMBRIDGE S-90B provides powerful analytical capabilities and high performance imaging to make it an ideal choice for failure analysis and other applications.