Used ECON 9100 #126391 for sale

ECON 9100
ID: 126391
Thin window / SiLi detector, full-quant.
ECON 9100 is a scanning electron microscope (SEM) designed for advanced materials analysis and imaging. It is a variable pressure scanning electron microscope (VP SEM), meaning it has an adjustable pressure capability that enables it to be used under different conditions depending on the sample being analyzed. 9100 uses an advanced electron beam source to generate the image. Electron beam sources are devices that produce electrons by converting energy into electrical current. The source produces a highly focused beam of electrons that is then focused onto the sample to be analyzed. ECON 9100 has a built-in automatic vacuum control equipment, which allows it to maintain a stable pressure environment when the microscope is in use. 9100 has an optical, imaging, and detection system which allows for high resolution imaging and analysis of the sample. It features an automated backscattered electron detector (BSD), which allows for imaging of the topography of the surface of the sample being analyzed. The BSD is also able to detect particles and other chemical compounds in the sample. ECON 9100 provides an effective unit for imaging and analysis of samples. Its advanced electronics, optics, and detection machine enable it to produce high resolution images with excellent contrast and detail. Its adjustable pressure setting further allows for the analysis of samples in various environments and conditions. The microscope has a compact, lightweight, and ergonomic design which makes it easy to use and transport. Its high resolution imaging capabilities are beneficial in a variety of applications, such as optical and electrical failure analysis, materials science research, 3D imaging, PCB inspection, and bio-medical imaging. In addition, due to its adjustable pressure settings, 9100 is also suitable for environmental research, corrosion studies, surface studies, coating thickness measurements, and cross-section analysis. Overall, ECON 9100 is an advanced scanning electron microscope that is suitable for a variety of research and analysis activities. Its adjustable pressure setting, advanced electronics, optics, and detection tool enable it to produce high resolution images with excellent contrast and detail. Additionally, it has an ergonomic and compact design that is easy to use and transport.
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