Used ELIONIX ELS-7500 #9055551 for sale

ELIONIX ELS-7500 is a Scanning Electron Microscope (SEM). It was designed for a variety of applications, including imaging of non-conductive materials and nanostructure analysis. It has multiple scanning modes, including low vacuum Mode, High Vacuum Mode and Bias field Mode, allowing for a wide range of application capabilities. The unit is designed for operation in a high vacuum environment, allowing for a more accurate measurement of electron emission. To achieve this, an intuitive and self-diagnostic equipment is implemented that should facilitate more efficient operation. The high vacuum environment facilitates high resolution imaging and efficient collection of electron emissions. The SEM is equipped with an electron column, a series of lenses, a specimen stage, and a sample holder. The electron column contains the electron source, the sample chamber and the electron optics. The specimen stage is capable of supporting specimens with a wide range of sizes and shapes and provides accurate movement of the specimen during imaging. The resolution of ELS-7500 is at least 0.1 nm, enabling the user to observe nanostructures and distortions with high accuracy. Additionally, the system is equipped with a state-of-the-art image analysis unit that supports a wide range of image processing algorithms, enabling more detailed analysis. ELIONIX ELS-7500 is also highly customisable and can be fitted with additional accessories, such as cameras, sample stages, specimen holders, environmental systems and automated imaging software. This allows the user to tailor the machine to their specific requirements. ELS-7500 is designed with a user-friendly interface and has an intuitive design, making it easier for the user to set up scans, analyse data and adjust parameters. Additionally, the unit is compatible with a range of automated imaging software, allowing for a more streamlined imaging process. Overall, ELIONIX ELS-7500 is an advanced SEM, capable of providing accurate and high-resolution imaging of nanostructures and distortions. Its user-friendly interface, wide range of applications and compatibility with automated imaging systems makes it an ideal choice for those in need of high-quality SEM imaging.