Used ELIONIX ELS-7500EX #293594292 for sale

ELIONIX ELS-7500EX is a scanning electron microscope (SEM) designed for industrial imaging applications, including failure analysis, semiconductor inspections, and surface morphology analysis. It offers a high-sensitivity field emission (FE) source, a resolution of up to 1.0nm, and a large stage and sample chamber for inspecting large samples. ELS-7500EX features a 300kV FE source with a range of beam currents, providing high-sensitivity electron detector signals with low environmental noise. The FE source is highly stable, eliminating sample artifacts caused by mechanical vibrations such as air turbulence. ELIONIX ELS-7500EX also features a low-current SE (secondary electron) mode, allowing for imaging at very low beam currents. The microscope utilizes a tiltable/rotatable large sample stage and sample chamber, allowing for large sample sizes and complex sample angles. The vacuum equipment offers a base pressure of 1 x 10-4 Pa, supporting a wide variety of specimen materials. The stage and sample chamber also feature fast scan and sample preparation functions, enabling rapid inspection of surface morphology and automatic preparation of 3D images. ELS-7500EX also offers a high-resolution optical system, with resolutions up to 1.0nm. The optical unit is designed for both bright field and dark field imaging, and is equipped with various lens accessories, allowing for variable magnifications. ELIONIX ELS-7500EX is ideal for industrial imaging applications, providing a highly accurate and stable imaging platform. Its unique combination of features, including a high-sensitivity FE source, a tiltable/rotatable sample chamber and high-resolution optical machine, makes it an excellent choice for imaging complex samples.