Used ERGOLUX Talos FX200 G2 #9237855 for sale

ERGOLUX Talos FX200 G2
ID: 9237855
Transmission Electron Microscope (TEM) P/N: 1097628 Includes: X-TWIN Lens Oil-free vacuum system Workstation with LCD monitor, 24" Smart camera Automatic aperture system Standard computer stage X-FEG Electron source Magnification calibration package Bottom-mount digital camera: 1100484 Ceta 16M camera 200 kV Compliance: 1048055 Seismic restraint kit Cooler / Compressor: 1095561 Cooling unit (Water / S2) EDS: 1120541 Super-X EDS detector Enclosure: 1099627 S2 Compliance kit including covers PC & Accessories: 1016773 Widescreen LCD monitor, 24" 1080297 Network PC Power options: 1113994 Mains matching transformer for TEM Specimen holder & accessories: FP 6596/05 Computer stage single-tilt holder 1097927 High-visibility low-background double-tilt holder Stage: 1099623 Piezo-enhanced computer stage (X, Y) STEM: FP 5401/02 4k x 4k STEM Data acquisition 1099619 HAADF Detector for 120/200 kV 1121647 On-axis BF / DF detector 1044267 STEM Image.
ERGOLUX Talos FX200 G2 is an advanced scanning electron microscope (SEM) designed for use in industrial, research and educational settings. It features a large, 200 mm field of view, enhanced chromatic and depth of field correction, and the latest in imaging technology for capturing and analyzing images in real-time. Its advanced electron optics allow for resolution up to 50 nm, and its intuitive software interface makes operation simple, fast, and efficient. The equipment features a five-axis motorized stage and large stage travel of 175 mm x 175 mm, allowing it to accommodate larger samples than traditional SEM systems. Its high-speed vacuum system operates up to ultimate vacuum pressure level of 5x10-7mbar. In addition, the ultra-low background noise level of 1.6eV gives it superior resolution and image quality. Talos FX200 G2 offers a variety of imaging capabilities, including white light interference, variable pressure, variable pressure plus, and secondary electron imaging. It also provides advanced imaging modes such as high-sensitivity imaging and energy-filtered imaging (EFI), which can be used to image elemental compositions of samples. Additionally, the unit features automated mapping for increased efficiency and consistency. ERGOLUX Talos FX200 G2 is equipped with a two-dimensional imaging machine that allows for the capture of both contour and profile images of the molecular structure of materials being examined. It also includes an asymmetric STEM detector for higher resolution imaging of datasets. The STEM-enabled imaging tool also comes with an optional dedicated energy range calculator for greater accuracy in analyzing samples. Talos FX200 G2 also offers a range of optional accessories, including gas-purge systems, an EDS analytical asset, an x-ray source, and an Environmental Chamber that allows samples to be imaged in a controlled environment. This enables the user to observe samples in an atmosphere that's conducive to the nature of the analysis being conducted. ERGOLUX Talos FX200 G2 is a flexible model that offers excellent imaging capabilities. Its broad range of features, combined with an intuitive user interface, make it a great choice for anyone who needs an advanced scanning electron microscope for applications in industrial, research and educational settings.
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