Used ESE US-8500X #9200460 for sale

The FEI ESE US-8500X is a Field Emission Scanning Electron Microscope, or FESEM, designed for precise imaging at the nano scale. This advanced instrument provides unparalleled accuracy in measuring small objects and organizing complex details. The 8500X uses a cold field emission electron source to produce an electron beam with very small angles of divergence. This beam is then honed using a set of electrostatic lenses, allowing for better focus and higher resolution. The 8500X has a unique design that includes a high vacuum chamber to minimize electron scattering from residual gasses, a vibration isolation table to reduce noise, and an automated electron accelerating voltage control for improved accuracy. The vacuum system allows for quick and precise imaging, with a high resolution of 0.9nm at 30kV. This design also allows for a generous sample chamber size of 2000 x 1000 x 400 mm. The 8500X features an intelligent control system that automates beam alignment and allows for superior micro-structural analysis. It has a maximum operating voltage of 30kV, with a maximum current of 13µA and a maximum sample rotation speed of 25 rpm. The 8500X can provide accurate and reliable imaging of both conductive and non-conductive samples at the nanometer scale. It has a samping range of 7-30kV and a detector collection angle of 5.6mRad. The 8500X also provides a wide range of accessories, such as energy filters, secondary electron detectors and field emission automated control systems. This equipment allows for up to 4 tilt axes control and up to 40 rotational stages, providing the capability to study micro-structural features in 3D. The 8500X is the optimal choice for researchers who need the highest possible resolution and accuracy for nanoscale imaging. It is ideal for tackling the most complex nanoscopic studies, offering an unparalleled level of detail for any application.