Used FEI Altura 835 #293754406 for sale

FEI Altura 835 is a dedicated scanning electron microscope (SEM) which is designed to provide high-resolution imaging and analytical capabilities. It includes a color cathodoluminescent (CL) detector, which enables the user to image and analyze specimens in both the visible and ultraviolet spectra. The SEM also features a large SEM chamber that facilitates the collection of a wide range of samples from both environmental and industrial sources. Furthermore, Altura 835 has a secondary electron (SE) detector which works in conjunction with the CL detector to provide high contrast imaging. The dynamic aperture of FEI Altura 835 is over 70mm, allowing for clear, sharp images of large samples. Additionally, the microscope is fitted with a Bald Peak Atlas electron gun which provides higher emission currents and longer life than traditional guns. This feature greatly enhances the performance of the microscope, and gives the user more control over the analytical capabilities of the SEM. The design of Altura 835 also includes a rapid sample exchange capability and a high-vacuum chamber that ensures high-resolution imaging. The chamber is capable of reaching a base pressure of 8x10-7 mbar, and is also equipped with a gas injection system for chamber pressure control. Additionally, the software that comes with the SEM enables the user to customize the microscope, allowing the individual to tailor the features to their specific needs. FEI Altura 835 also benefits from modern technological innovations that improve its imaging capabilities. For instance, a Field Emission Schottky (FES) source is used to reduce the amount of charging effects and improve the resolution of the images. The microscope is also capable of automated image stitching, which allows the user to obtain images of large samples over a larger field of view. Furthermore, the SEM incorporates automated routines for filtering, templating, and auto-spotting. In conclusion, Altura 835 is an advanced scanning electron microscope that provides excellent resolution and temporal resolution. Its integrated CL detector and electron gun enables high contrast imaging of large samples, while its many automated routines provide the user with an unparalleled imaging and analytical experience.