Used FEI Altura 835 #293761494 for sale

FEI Altura 835 is a scanning electron microscope (SEM) designed for high resolution imaging and analysis capabilities. It is an intermediate-level SEM configured with advanced imaging capabilities, including 3-axis scanning and digital image cropping functionality with an easy to use graphical interface. The SEM internally supports a wide range of secondary electron (SE) detectors for morphology and composition analysis, including a solid-state backscatter detector (SBD), an Energy Dispersive X-ray (EDX) spectrometer for element analysis, a liquid nitrogen-cooled ultra-low loss electron energy filter (EELF) for chemical state imaging and analysis, and a wide range of detectors for combining secondary, backscatter and X-ray imaging. Altura 835 incorporates an advanced signal to noise optimization that allows greater imaging detail to be captured including an on-stage signal amplifier with a special low noise design and a variety of filtering and signal enhancement technologies to optimize signal-to-noise ratio. The SEM is also equipped with a high-resolution monochrome camera and a variety of x, y, z-positioning and stitching software to automate and streamline imaging acquisition. Analytical capabilities of FEI Altura 835 include an automatic sample surface noise analysis that generates surface area, volume, and particle size distributions. Additionally, it also supports automated pattern recognition, as well as surface structure measurements like atomic force microscopy (AFM). Composition analysis with the EDX detector can be used to characterize nanoscale elemental distributions, with multi-channel setup for simultaneous measurement of multiple elements, and spectral imaging for mapping of region-resolved elemental distributions. In order to maximize user-friendliness and capability, Altura 835 comes with an automated operational system that simplifies preparation and analysis of specimens. This automated system provides an intuitive user interface for the measurement process, where users are able to visualize, control, and monitor the microscope in real-time. Furthermore, the system comes with comprehensive software tools and advanced algorithms that provide powerful data management, imaging, data visualization and analysis capabilities. Ultimately, FEI Altura 835 is a versatile SEM platform equipped with advanced imaging and analysis capabilities that enable researchers to explore and characterize materials and nanostructures with high accuracy.