Used FEI Altura 835 #9286978 for sale

FEI Altura 835 is a state-of-the-art scanning electron microscope (SEM) that combines advanced technology for ultimate performance when imaging and analyzing specimen surfaces. It features a heavy duty SEM column and fast scanning stage, which provides precise specimen positioning, rapid scanning speed, and high resolution imaging. The equipment offers a wide range of analytical capabilities, including energy dispersive X-ray (EDX) detectors that can analyze elements in both organic and inorganic samples, offering a wealth of information about materials structure, composition, and surface morphology. Altura 835 also features a high-resolution electron column with a 5-axis deflector system. This unit's three 2-axis scan deflectors provide very fast scanning speed while maintaining excellent source-to-specimen focus and image quality. The high accelerating voltage provided by FEI Altura 835 makes it suitable for conducting multiple imaging techniques such as backscatter electron imaging. The machine's tilt stages enable users to acquire images in multiple tilt angles in order to assess a specimen's surface topology. The microscope also offers a low voltage imaging mode that enables observation of very fragile specimens without fear of damage or alteration. Altura 835's high resolution EDX tool provides rapid elemental mapping of samples. This makes it excellent for analyzing the chemistry of organic and inorganic materials. The EDX asset is comprised of a detector, EDX workstation, and associated software, enabling quick and easy element mapping. The detector features a resolution of 144 spectral channels for unbiased quantification of material composition. FEI Altura 835 offers a wide range of features for analyzing a variety of specimens. It comes with a large sample chamber and workspace, enabling users to monitor the development of three-dimensional specimens with the hel of a stage motor. It also includes features such as magnetic sample handling, digital encoders, and automatic tracking for easy navigation and positioning of multiple specimens. Altura 835 is an ultimate tool for those looking for advanced imaging and analytical capabilities in a scanning electron microscope. Its cutting-edge design and technology make it an ideal tool for acquiring high resolution images and analyzing materials structures and compositions. The model's user-friendly interface makes it straightforward for users to setup and use the microscope, providing users with top-notch performance when investigating sample surfaces.