Used FEI Altura 835 #9350300 for sale

FEI Altura 835 is a scanning electron microscope that is capable of providing high-resolution imaging for a wide variety of materials and applications. The microscope has a fully motorized stage for effortless sample positioning and provides excellent images in both bright and dark mode. This allows for easy sample inspection from a variety of angles and magnifications. Altura 835 is equipped with an automatic control of the electron beam to maximize the number of resolution elements and ensure fast and consistent sample imaging. Its SECtec technology is an advanced imaging platform that provides superior image resolution and contrast for a wide range of applications. In addition to its advanced imaging capabilities, FEI Altura 835 is also capable of capturing 3D images. This is done via a high-speed backscattered electron beam detector that provides tomography for a three-dimensional view of the sample. Additionally, the microscope features advanced edge analysis tools which can be used to measure 2D and 3D structures on a sample and gain a deeper understanding of the material's characteristics. Finally, Altura 835 is furnished with a variety of useful supporting components. These include a powerful Silicon Drift Detector (SDD) for energy spectrometric imaging, a programmable software module which allows the user to store images and settings, and a gas-filled Torr chamber for operating the scanning electron microscope in ultra-high vacuum environments. Overall, FEI Altura 835 is a versatile and powerful scanning electron microscope with advanced imaging capabilities. It provides excellent image resolution in both bright and dark mode, has automated sample positioning, and can capture three-dimensional images using its SECtec platform. In addition, its supporting components such as a Silicon Drift Detector and a programmable software module make it ideal for a wide range of applications.