Used FEI CLM960 #9298309 for sale

FEI CLM960
ID: 9298309
Focused Ion Beam (FIB) system.
FEI CLM960 is a high-performance scanning electron microscope that provides high-resolution imaging capabilities for a wide range of applications. It is a single-column microscope configured for field emission (FE) technologies and provides enhanced analytical capabilities such as electron energy loss spectroscopy (EELS), energy dispersive X-ray spectroscopy (EDS) and high-angle annular dark-field imaging (HAADF). CLM960 utilizes a 5-pole wien field emission electron gun (WGFE) that provides ultra-stable and weakly-focused low-vacuum operation. The field emission gun allows for lower beam current and higher acceleration voltage, providing improved contrast and resolution of the smallest features. An automatic aberration corrector system included with FEI CLM960 offers dynamic image and contrast correction, allowing for faster digestion of sample information. This system utilizes an adjustable chromatic aberration corrector and a stigmatic aberration corrector, providing dynamic image optimization and superior contrast over a wide range of magnifications. CLM960 also offers an advanced aberration corrector package that provides advanced imaging and analytical capabilities, such as convergent-beam electron diffraction (CBED), electron energy loss spectroscopy (EELS) and high-angle annular dark-field imaging (HAADF). FEI CLM960 provides an easy to use user interface with large digital navigation buttons, a large visual display, and an improved motorized stage that allows for fast and precise sample scanning. The motorized stage also includes a sample holder that is capable of supporting samples of any size. CLM960 delivers leading-edge imaging capabilities and is ideal for a variety of materials research applications such as nanoscale imaging and analysis. With its combination of powerful capabilities and user-friendly features, FEI CLM960 is an impressive instrument that offers reliable performance for any analytical application.
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