Used FEI FIB 200 #9082663 for sale

FEI FIB 200 is an advanced, high-resolution scanning electron microscope (SEM) designed for applications such as materials analysis and materials characterization. It utilizes a focused ion beam (FIB) to allow highly magnified, detailed images of the internal structure of materials, as well as the ability to take samples with atomic precision. With its advanced electronics and optics system, FIB 200 provides higher resolution and faster scanning than most SEMs. FEI FIB 200 utilizes a field emission source to provide electrons at extremely high currents. These electrons are focused by a series of electromagnetic lenses and then accelerated by an anode to the sample. When the electrons interact with the sample material, they generate distinct signals that are then detected by the SEM system and processed into images. FIB 200 has a spherical aberration corrector that allows it to achieve higher resolution images of small features. The focused ion beam incorporated in this system is a critical aspect of sample preparation. The FIB allows users to take an area of sample material and cut it into thin layers for further analysis. This cutting process is incredibly precise, allowing samples to be prepared with atomic precision. It also allows for the removal of surface atoms and the deposit of probes and substrates into the sample. FEI FIB 200 also provides a suite of image analysis and measurement tools that allow users to analyze the materials with greater accuracy. This includes tools such as multidimensional color mapping and automatic feature templates. Data can be exported for further analysis, or saved for future reference. Overall, FIB 200 is an advanced SEM, equipped with tools to provide invaluable information on nanoscale materials. Its unmatched precision and resolution, coupled with its integrated FIB, make it an ideal instrument for material analysis and characterization.