Used FEI FIB 200 #9178157 for sale

FEI FIB 200 is a high-resolution, innovative piece of scanning electron microscope (SEM) technology from FEI. This advanced scanning electron microscope simplifies the observation of materials and objects at the nanoscale. It utilizes a combination of focused ion beam (FIB) and scanning electron microscopy, offering powerful imaging capabilities and sample preparation options. FIB 200 incorporates a high-energy FIB system and a high-vacuum field emission scanning electron microscope into a single instrument. The powerful FIB system enables greater analysis capabilities, offering low parasitic beam currents and four-beam operation. This makes it possible to precisely analyse small features and signatures on a variety of surfaces, and offers excellent image contrast and resolution. The field emission scanning electron microscope of FEI FIB 200 is highly efficient and provides superb images of any sample surface or material, even when operating at lower accelerating voltages. It supports imaging in both elemental and crystallographic modes, and includes automated SEM alignment, so users can focus and tilt the sample independently. Further features of FIB 200 include an interactive operation panel, large field of view, and an automated software system for sample navigation. The easy-to-use interface and automated panel operations allow for rapid navigation to the desired area in the sample, so analysis can be performed faster, and with less effort. For sample preparation, FEI FIB 200 offers a variety of cutting options and the ability to tilt and modify samples. Depending on the user's requirements, samples can be cut, milled, slimmed, or polished with high precision. The powerful combination of a FIB and advanced SEM offered by FIB 200 makes it a great choice for analysis and evaluation of materials and objects at the nanometer scale. This versatile and reliable machine is capable of meeting high precision and production requirements, and makes it easy to observe even the most delicate of features on a range of surfaces and materials.