Used FEI FIB 200 #9179238 for sale

FEI FIB 200 is a field emission scanning electron microscope (FESEM). It is a type of electron microscope that uses a low energy, high resolution scanning electron beam to obtain crisp and clear images. FIB 200 consists of a pair of concentric cylinders that contain a source of electrons and a detector situated parallel to the electron beam. The source of the electrons is generated from a field emission gun (FEG) which is a type of electron gun utilizing fields of intense electric potential to emit electrons. The electrons accelerated between the two concentric cylinders strike a specimen grid, creating a pattern of secondary electrons and backscattered electrons. Collectively, these electrons form an image revealing the structures and features of the specimen sample. The device also features variable electron beam currents ranging from 0.1-200 pA and variable accelerating voltages ranging from 0.1-30 keV, enabling researchers to obtain images of the finest detail. Additionally, FEI FIB 200 allows researchers to use a range of imaging techniques, including: secondary electron imaging, analytical scanning minchanneling imaging, backscatter imaging and energy-dispersive X-ray (EDX) analysis. FIB 200 also provides a variety of options for sample preparation, analysis, and modification, including: cryo-prep, ultramicrotomy, ion milling and gas injection systems. By combining the features of this instrument with those of a traditional SEM, researchers and engineers alike are able to achieve their desired outcomes with the ultimate levels of precision. FEI FIB 200 system is simple to operate, user-friendly, and highly efficient, making it an essential tool for laboratories of all types. With the numerous benefits this system has to offer, users can expect to obtain greater accuracy when viewing specimen samples, as well as fantastic results in analysis and imaging.