Used FEI FIB 200 #9265437 for sale

FEI FIB 200 is a market-leading scanning electron microscope (SEM) designed for imaging and analysis of a wide range of specimen types. This high-performance instrument is based on field emission electron sources and technical innovations that allow for improved imaging at the sub-nanometer level. The SEM produces secondary electrons that interact with the specimen, resulting in contrast and detail in the resulting images. FIB 200 is equipped with an inertial lithography system that allows for precise, rapid prototyping of samples as small as 10 nanometers. This system utilizes two electron beams which can be focused and scanned across the target area providing the user with high precision imaging and patterning capabilities. The secondary electron signal is monitored and data contrast is adjusted in real-time giving the user the ability to efficiently analyse a wide variety of sample types. The SEM also features a variable beam current control which permits image contrast adjustment without the need to halt imaging. The instrument is fitted with a state of the art digital signal detector, coupled with a powerful electron gun to provide excellent contrast and resolution of the images. Additionally, FEI FIB 200 is able to perform energy dispersive X-Ray (EDX) spectroscopy in order to create depth profiles of specimens. The detectors are sensitive to a wide range of elements and the results can then be evaluated in the software. FIB 200 has powerful automation and procedural functions available for a variety of user-defined operating parameters, such as imaging protocols and parameters for the lithography and deposition processes. Finally, FEI FIB 200 boasts a user-friendly interface and includes a large amount of tutorials and sample images to help the user become familiar with the instrument. This makes it an ideal tool for researchers, technicians and students in need of high-resolution imaging and analysis.