Used FEI FIB 800 #9195240 for sale

FEI FIB 800 is a type of scanning electron microscope (SEM) used in the analysis of a wide range of materials. It makes use of intense electron beams to scan a sample and produce images at high magnifications. The electron beam is generated by a tungsten filament operated at high voltage in a vacuum chamber. This system is able to produce highly detailed nanoprobes, used to capture images at high resolution. FIB 800 is capable of resolutions as high as 2000 nm. The sample is mounted onto a stage attached to a series of linear motors that can be used to move the sample in small steps. The beam is focused onto the sample by electrodes and various lenses, producing a large field of view. A detector is used to capture the signals generated from the electrons interacting with the sample. The data is then used to create images that can be analyzed for features and defects. FEI FIB 800 comes equipped with a variety of useful features, including a range of electronics, vacuum pumps, power supplies, and cooling systems. It also has three-axis and remote control systems, allowing remote control of the sample stage. The accelerating voltage can be adjusted from 0.1 to 30kV, and an adjustable beam current gives additional control over resolution. FIB 800 is a versatile tool for inspection and analysis of a range of samples, from metals to semiconductors. It produces high-quality images at high magnifications, helping engineers and researchers gain insight into the features of their materials. The range of features and adjustability makes FEI FIB 800 a perfect choice for a variety of microscopy applications.