Used FEI FIB 800 #9200349 for sale

FEI FIB 800 is a high-end scanning electron microscope (SEM) designed for advanced imaging applications. It is equipped with an advanced analytical package which includes an energy dispersive x-ray spectrometer (EDS), a Wavelength Dispersive X-ray spectrometer (WDS), and an Au-metal evaporator to facilitate surface-sensitive analysis techniques. This instrument is used for sub-nanometer scale imaging and analysis in a variety of disciplines including materials science, geology, semiconductor engineering and biology. FIB 800 is capable of displaying extremely high levels of detail and resolution in its imaging capabilities. The SEM utilizes a unique scanning electron beam operating at a number of different beam energies to obtain secondary electrons, backscattered electrons, spectrum analysis, energy loss spectrometry, and low voltage imaging. This allows for great accuracy in capturing and analyzing extremely small objects such as viruses or crystal lattices. The illumination of the imaged area can also vary intensity and is adjustable to accommodate various sample thickness and surface conditions. FEI FIB 800 has a chamber equipped with an electrically controlled specimen stage which allows for imaging both static and dynamic processes in real-time. This stage has high accuracy and precision in moving the specimen with very low inertia and vibrations which are especially beneficial when imaging fragile or biological samples. The EDS enables the user to identify and analyze the elemental composition of the sample material. The WDS is used to detect and quantify the composition of x-rays emitted from the sample when the beam is bombarded with electrons, while the evaporator enables sputtering or deposition onto the specimen surface. Additionally, this instrument's imaging capabilities are further enhanced by its in-built analysis software which can be used to measure the area, intensity, edge sharpness and even surface elements of sample features. FIB 800 is powerful, sophisticated tool and is capable of performing a variety of complex imaging and analysis tasks on a variety of samples. Its superior resolution and extensive analytical capabilities make it well suited for a variety of imaging applications.