Used FEI FIB 800 #9393458 for sale
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ID: 9393458
Focused Ion Beam (FIB) System
Deposition system: Pt, EE
XL50 Motor stage: 200 mm
Loadlock type: Loadlock
Detector: CDEM
I-Gun:
Type: Prelens column
Beam current: 1 pA - 11 nA
Vacuum type:
Turbo-molecular pump
Mechanical pump
Ion getter pump
Operating system: MS Windows NT.
FEI FIB 800, developed by FEI Company, is a powerful scanning electron microscope with advanced features for high resolution, imaging, and microanalysis capabilities. With its large field of view and ultra-high resolution imaging, FIB 800 can achieve unprecedented levels of detail and depth of information in many scientific and industrial applications. FEI FIB 800 is equipped with a twin gun field emission gun (FEG) electron optics column and a cold field emission scanning electron microscope (CFEG-SEM), a unique combination of technologies that enable unparalleled image quality, resolution, and depth of field. The FEG column is responsible for the generation of a high flux of e-beam to create extremely clear and sharp images with high contrast and resolution. The CFEG-SEM technology is designed to provide extremely detailed images with a maximum resolution of up to 2nm, one of the highest achievable resolution levels in the scanning electron microscope industry. The versatility of FIB 800 extends to applications in materials science, chemistry, geology, and biological fields where resolutions higher than 10nm or 100nm are needed. In addition to its high resolution imaging, FEI FIB 800 also features a range of sophisticated analytical techniques, such as device probing and nano-OVIT programming, energy-dispersive X-ray spectroscopy (EDS), electron backscatter diffraction (EBSD), low-kV secondary electron imaging (SEI), Atomic Force microscopy (AFM), and more. Additionally, FIB 800's advanced software package allows automated analysis and collection of data, enabling users to analyze results quickly and accurately. FEI Visualization software suite includes a range of powerful tools, such as automated region position detection, for accurate measurement and instant results. FEI FIB 800 is the perfect choice for professionals seeking the highest level of imaging and microanalysis capabilities in a scanning electron microscope. With its combination of advanced features, FIB 800 can meet the most demanding requirements in a wide range of scientific fields.
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