Used FEI FIB-800THP #9104128 for sale

FEI FIB-800THP is a scanning electron microscope (SEM) that can be used to view and analyze a variety of different materials at high resolution. It produces extremely detailed images of the samples it views, making it ideal for a variety of applications. FIB-800THP is capable of imaging samples with resolutions as low as 1 nanometer. This means that it can image individual atoms, most of which are typically invisible to the naked eye. It is ideally suited for materials research, providing a detailed landscape of material properties such as composition, microstructure, topography, defect analysis, and more. FEI FIB-800THP can also be used for many different materials characterization techniques, including energy dispersive spectroscopy (EDS) and electron backscatter diffraction (EBSD). These are important processes used to identify the composition and structure of a sample. EDS can produce images of the elemental composition across large surfaces and EBSD can be used to analyze crystal structure and texture. In addition, FIB-800THP can be used for a variety of imaging modes such as backscattered electron imaging (BSE), secondary electron imaging (SEI), and cathodoluminescence (CL). BSE images are created from the reflection of an electron beam off of a sample's surface, creating a contrast between the different materials in the area. SEI images focus on the sample's surface topography, producing very detailed images at resolution as low as 0.5 nanometers. CL produces images by measuring the emission of visible light following the electron bombardment of a sample. Overall, FEI FIB-800THP is an incredibly versatile imaging tool that can be used for applications ranging from materials research to semiconductor analysis. Its high resolution and variety of imaging techniques make it the ideal choice for a multitude of applications.