Used FEI Inspect F50 #9224409 for sale

FEI Inspect F50 is a scanning electron microscope (SEM) designed for non-destructive analysis of materials. It offers a range of features to provide the highest quality imaging technology, including advanced design and engineering for higher sample throughput, excellent resolution and accuracy. Inspect F50 is equipped with an in-column energy filter detector, which can enhance resolution and provide more accurate imaging of fine structures in samples. In addition, the in-column detector is adjustable to provide the ideal balance between contrast and overall field of view. This ensures that operators can achieve optimal contrast and image quality, which is especially useful for viewing thin layers of material. The in-column energy filter detector also reduces the total ionizing dose (TID) received by samples, making it ideal for damage-sensitive material. FEI Inspect F50 also features a variety of advanced imaging options, including backscattered electron (BSE) imaging, variable pressure imaging, and electron backscatter diffraction (EBSD) imaging. The SEM's backscattered electron mode enables operators to detect the elemental composition and chemical state of samples. Variable pressure imaging provide higher quality imaging in low vacuum, making it ideal for applications involving chemical alterations, such as corrosion mapping and imaging of hydrated samples. Finally, EBSD imaging can be used to analyze the crystallographic structure of samples, which offers important insight into their properties and behavior. Inspect F50 also has a range of user-friendly features to make sample preparation, imaging, and analysis simple and straightforward. For example, the stage motor offers a wide range of travel with xyz and theta control, so users can quickly and accurately move their samples into position for imaging. In addition, the operator console provides easy access to all microscopy functions and settings, enabling experts and newcomers alike to make use of the SEM's capabilities. Overall, FEI Inspect F50 is an excellent SEM for materials research and analysis. Its combination of advanced imaging capabilities and an intuitive operating system make it an ideal choice for research laboratories and industry alike.