Used FEI Inspect S50 #293605298 for sale

FEI Inspect S50 Scanning Electron Microscope (SEM) is a high-end imaging instrument adept at generating extremely detailed images of small objects at high magnifications. It uses a focused raster of electrons to image through a range of magnifications, and has the ability to capture a variety of physical and chemical properties. Inspect S50 provides a comprehensive range of imaging capabilities, with its excellent signal detection, precise chemical and elemental mapping, and precise X-Ray spectroscopy abilities. Its specialized software allows for precise data analysis of a range of materials. Due to its high level of resolution, FEI Inspect S50 is capable of imaging features at nanometer scale levels. The microscope's magnification can range from 2,500x to up to 120,000x, and features a wide field of view. The exceptional large depth of field lets researchers capture large samples at high magnification with remarkable clarity and accuracy. The high detection limits, both in terms of spatial resolution and depth of focus, make Inspect S50 ideal for examining fine structures and identifying and quantifying ultra-thin layers in samples. The superior imaging capabilities also offer excellent 3D information and high-resolution mapping of micro-defects and particles in a wide range of materials. In addition to its exceptional imaging capabilities, FEI Inspect S50 also offers advanced analytical tools, including Energy-dispersive (EDS) and Wavelength-dispersive (WDS) X-Ray spectroscopy for identifying chemical and elemental composition of samples. This means users can precisely and accurately analyze the material compositions of their samples. Overall, Inspect S50 is an extremely useful tool for scientists and researchers that need a powerful, versatile imaging system to aid them with their research. Its excellent imaging capabilities and high-end analytical tools make it an ideal choice for those requiring detailed, precise analysis and imaging of small objects.