Used FEI Inspect S50 #293624510 for sale

FEI Inspect S50 is a scanning electron microscope (SEM) used for research and materials analysis. This high-resolution SEM allows for fast and precise imaging over wide areas with a magnification up to 500,000x. Inspect S50 features a specific digital detector for topography imaging on both organic and inorganic materials. Its digital phase-contrast imaging technique is capable of allowing users to inspect various stages of development in biological systems, from cell walls to particular biomolecules. Its digital closed-loop control technology provides precise scanning with long operational life expectancy and fast data acquisition, producing high-contrast imaging. The integrated CCD camera and image controllers feature advanced image processing and on-the-fly filtering capabilities. These imaging capabilities, paired with an intuitive user interface, allow operators with limited SEM experience to produce reliable, repeatable results. FEI Inspect S50 also offers a number of advanced automation options such as automated fast-scanning across large fields of view, automated image stitching, and automated data analysis. The on-board pre-scan chromatic and orientation correction system minimizes downstream analysis time and improves throughput. Inspect S50 is also equipped with an environmental chamber. This enables users to perform imaging and measurement of uncovered samples in a controlled environment. Features such as integrated heating and cooling, automated gas flow control, and sample environment monitoring make it possible to maintain precise environmental conditions for even the most delicate samples. In summary, FEI Inspect S50 is a high-resolution SEM that offers advanced imaging and automation capabilities for reliable, repeatable results. It is capable of producing topography images at magnifications up to 500,000x, and its environmental chamber allows it to provide imaging and measuring of uncovered samples in a controlled environment. This system makes it well suited for any materials analysis and research application.