Used FEI Inspect S50 #9150862 for sale

FEI Inspect S50 is a scanning electron microscope (SEM) with a unique combination of imaging, analytical and rapid 3D tomographic capabilities. The S50 has a resolution of 0.8nm enabling it to produce images with exceptional detail. It also boasts a large 300mm working distance, allowing users to produce sample images up to 120x160mm in size quickly and easily. Inspect S50 also has an additional type of electron detector, which allows users to measure the thickness and composition of samples without damaging them. This is achieved through the Electron Backscatter Diffraction (EBSD) detector. The EBSD detector can also be used to measure stress and strain in samples in situ. The S50 also offers a range of other features. It has the ability to measure thin layers in the nanometer range. This is made possible by the microbeam system, which provides repeatable data acquisition with up to 4KV acceleration voltage. The S50 also comes with an integrated spectrometer, allowing users to measure X-ray emission or backscattered spectra to accurately determine material composition. In addition, the S50 is capable of advanced 3D tomography. With up to 43nm three-dimensional resolution, users can generate reconstructions of minute structures with unprecedented detail. The S50 also offers advanced imaging features, such as automated stitching, which allows users to stitch images together to generate a larger image with greater image detail. Overall, FEI Inspect S50 is an excellent scanning electron microscope for imaging, analytical and 3D tomographic tasks. With its exceptional resolution, large working distance, wide range of detectors and advanced imaging features, the S50 is capable of producing detailed and accurate images of samples of various sizes and materials.