Used FEI Inspect S50 #9159235 for sale

Name: FEI Inspect S50
Brand: FEI
SKU: 9159235
Availability: InStock

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Scanning Electron Microscopes

Manufacturer

FEI

Model

Inspect S50

ID: 9159235

Vintage: 2010

Scanning Electron Microscope (SEM) Secondary Electron Detector (SED) Large Field Detector (LFD) low vacuum GBSD Included IR Camera for viewing sample in chamber Electron beam current measurement Color optical camera for sample navigation Tungsten hair pin type TMP Vacuum system Fully motorized stage system XL 30 Chamber system USB Connecting board nonfunctional 70 l/s Turbo Molecular Pump (TMP) Patented through-lens differential pumping Beam gas path length: 10 mm / 2 mm Oil rotary pump Chamber vacuum (High): 9.10-4 Pa Chamber vacuum (Low) < 10 to 270 Pa Evacuation time: ≤ 150 s to (High vacuum) ≤ 270 s to (Low vacuum) Low vacuum: 3.0 nm at 30 kV (SE) 4.0 nm at 30 kV (BSE) 10 nm at 3 kV (SE) Sample holders: Multi-stub holder Single stub mount Mounts directly on to stage Wafer and custom holder Does not include: Scintillator BSED / CLD Low Voltage Contrast Detector (VCD) High Contrast Detector (CD) Gaseous Analytical BSED (GAD) Cathodoluminescence WDS and EBSD Stem detector Packing list: Main chamber with desk for display (2) Control PCs (2) Monitors Oil rotary pump Control pad Keyboard Operating system: Windows 2000 2010 vintage.

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FEI Inspect S50 is a versatile and reliable scanning electron microscope (SEM). This magnifying microscope has a magnification range up to fifty thousand times, making it ideal for applications requiring superior detail. It is able to use secondary electrons, backscattered electrons, and through-the-lens detector systems to observe the desired sample. The equipment utilizes a unique in-lens detector process to maximize accuracy and create clear images of the sample. As an added benefit, this detector minimizes matrix interference and eliminates distortion, resulting in superior images in comparison to other SEMs. Inspect S50 offers a wide range of user-friendly features that make it an ideal choice for those who need a precise and efficient scanning electron microscope. The system includes a digital X-ray detector, automatic drift correction unit, and fast scanning capabilities that make it easy to use and provide efficient specimen imaging. In addition to its comprehensive scanning capabilities, FEI Inspect S50 also offers multiple peripheral systems for further analysis. These include a cryogenic machine for improved temperature regulation, as well as an Environmental Scanning Electron Microscope (ESEM) for specialized analyses, such as ultra-low vacuum imaging. Additional features include fully automated calibration, advanced scanning techniques, dual detector design for superior analytical capability, and a large collection of accessories. Inspect S50 offers high performance imaging capability and a variety of features, making it the ideal tool for samples requiring high resolution and detail. Its easy-to-use design and comprehensive peripheral systems make it an ideal choice for a variety of specialized applications.