Used FEI Inspect S50 #9293781 for sale

FEI Inspect S50 is a scanning electron microscope (SEM) used in a variety of industries for environmental characterizations, imaging, and analytical measurements. It is a multi-technique platform that allows for both qualitative analysis and quantitative imaging on a single microscope. Inspect S50 utilizes the latest technology, combining a unique combination of SEM, EDX, and EBSD functionalities. This provides an extremely high level of imaging precision and detail which is far superior to traditional imaging methods. The machine features a large, high resolution color display, allowing for easy observation of images at a variety of magnifications. A unique guide-through navigation procedure allows for accurate operation. The microscopic mode of FEI Inspect S50 permits analyses of materials at sub-micron levels, offering far more resolution than other methods. The energy dispersive (EDX) spectroscopy functionality of Inspect S50 allows for elemental composition analyses, giving users the ability to detect and analyze elemental concentrations, even when the element is present at a very low level. A unique Energy Filtered Electron Backscattered Diffraction (EBSD) offer unparalleled control over orientation and grain size of materials. FEI Inspect S50 is available in two versions - the regular version and the conductive version. The regular version of Inspect S50 features high levels of imaging resolution and speed, with an operating voltage of up to 30kV. The conductive version of FEI Inspect S50 offers a higher working voltage of up to 45kV, combined with higher image resolution and faster speeds for higher performance analysis. Inspect S50 is designed for ultimate operational reliability. The platform is equipped with an integrated vacuum system, providing high residual pressures and optimized ionization levels for a stable and safe working environment. This allows for extended periods of uninterrupted operation without the need for routine maintenance. FEI Inspect S50 is a highly efficient tool for environmental characterizations, imaging, and analytical measurements. It features a unique combination of SEM, EDX and EBSD capabilities, with high levels of imaging resolution and speed. The integrated vacuum system ensures an ultra-stable environment and reliable long-term use, while the high working voltage of up to 45kV provides further accuracy.