Used FEI Inspect S50 #9402635 for sale

FEI Inspect S50 is a state-of-the-art scanning electron microscope (SEM). The advanced imaging and analysis capabilities of the equipment are designed to provide superior performance and analytical power for inspecting, analyzing and characterizing a broad range of materials in many industries. Inspect S50 is equipped with a field-emission gun (FEG) that uses a concentrated beam of electrons to create high- resolution, high-contrast images. An integrated digital signal processor (DSP) increases the speed of image acquisition by four times, resulting in faster operation and improved throughput. The system also includes a dual-stage cold-field emission (CFE) gun with exceptionally low noise and high throughput for superior quality imaging. The unit has a high-performance 5 megapixel (5MP) camera for improved imaging quality and clarity. A large chamber enables the manipulation of samples up to 22 millimeters in size, and automated stages allow for precision positioning and sample navigation. The machine features energy dispersive spectroscopy (EDS) with a large silicon- drift detector (SDD) that provides improved elemental analysis. FEI Inspect S50 is equipped with a suite of software tools designed to maximize performance and productivity. These tools include automatic stage manipulation, 3D electron tomography, automated image processing and correction, sample tracking, and spectral analysis. These features make Inspect S50 an ideal instrument for applications such as materials research, failure analysis, and nanostructure analysis. Overall, FEI Inspect S50 is a powerful and highly versatile scanning electron microscope, providing superior imaging and analysis capabilities for many industries. With its advanced features and user-friendly interface, the tool is uniquely suited for many applications and is the ideal choice for laboratories seeking high performance and flexibility.