Used FEI Magellan 400 #9180764 for sale

FEI Magellan 400 is a scanning electron microscope (SEM) that is widely used in a variety of research and industry applications. Magellan 400 is a powerful SEM that provides a variety of imaging modes, including secondary electron imaging, backscatter electron imaging, electron-beam-induced current imaging, and a novel imaging mode known as 4D imaging. This 4D imaging mode combines all three imaging modes in a single frame to provide higher contrast and features that would be difficult to detect with any of the imaging methods separately. FEI Magellan 400 is equipped with a unique charge control system that enables it to capture images with very low noise levels and high contrast. It also features a unique electric current control system that allows the user to control the electron beam waveform in real time. This makes it possible to generate more than one waveform and to generate specific patterns that can be used to enhance contrast and detail in the images. Magellan 400 is also equipped with a high-end X-Y sample stage that provides a precise control over the translation and rotation of the sample. The sample stage can also be used to analyze surface features at high magnification, such as topography and pattern features. In addition, the microscope includes a built-in light source that allows for direct observation of the sample in transmitted light, making it a valuable tool for optical analysis. FEI Magellan 400 is capable of providing both imaging and analytical capabilities. Its ability to provide simultaneous imaging modes and its long working distances make it ideal for materials science and semiconductor applications. Its sophisticated analysis and imaging modes make it suitable for use in markets such as medical diagnostics, nanotechnology and other research and industrial applications. The instrument can be used to image a wide variety of materials including metals, semiconductors, and polymers, as well as biological samples. Overall Magellan 400 is a versatile scanning electron microscope offering high-resolution imaging and analytical capabilities for a variety of application areas. The instrument can be used to capture images with low noise levels and high contrast, to generate multiple waveforms, to analyze topography and pattern features, and to observe samples in transmitted light.