Used FEI Morgagni 268 #293603094 for sale

ID: 293603094
Scanning Electron Microscope (SEM) Accessories.
FEI Morgagni 268 is a scanning electron microscope (SEM). It is the latest technology in scanning electron microscopy and offers very high resolution images of samples on the nanoscale. The Morgagni is equipped with a high-resolution cold field emission gun (FEG) which can achieve a resolution up to 1.7nm at 15kV and 120kV acceleration voltages. It is capable of achieving a maximised field of view and with a voltage selectable FEG it can provide the best sensitivity versus resolution trade-off. A key feature of the Morgagni is its energy selector module, which is a mechanically driven monochromator. This module is used to block out electrons of unwanted energies or to only permit selected energy ranges. This feature allows for the manipulation of the microscope's resolution, working distances and lifetime magnifications for particular samples. Featuring a built-in automated pattern recognition system and microprocessor controlled specimen stage, the Morgagni offers a variety of sample manipulation options. The samples can be imaged in variable vacuum levels, from ultra-high vacuum to moderate vacuum and the variable sample decks allow the specimen to be held in a variety of orientations. The Morgagni can be integrated with a range of detector systems such as secondary electrons (SE), backscattered electrons (BSE), field emission gun (FEG), and energy analysis systems, to individually identify and image multiple elements and species. The software bundled with the Morgagni offers automated operation while capturing quantitative images. With auto-focus and compensation features, an auto-calibration system, and auto-centring, it allows the user to easily perform large-scale imaging operations with ease. Morgagni 268 is a powerful and versatile tool that can be used to capture high resolution images of samples on the nanoscale. With its ease of use and high-end functionality, it is the perfect choice for studying small specimens at the nanoscale.
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