Used FEI Nova NanoSEM 230 #293635143 for sale

FEI Nova NanoSEM 230 scanning electron microscope is the latest in high-resolution imaging technology for the study of microstructures on a nanoscale. This instrument has several unique features that make it an extremely powerful tool for imaging objects at ultra-high magnifications, including its ability to perform both scanning and transmission electron microscopy, as well as scanning auger microscopy. FEI Nova NanoSEM is built with a fully automated stage and offers stage travel speeds of up to 8 cm/s, making it an ideal solution for high throughput imaging setups. Unique to FEI Nova is its Auto-Tune technology, which allows the microscope to be perfectly calibrated out of the box with minimal user input, reducing the learning curve for the user and allowing for an easy transition to the imaging process. The microscope is also built with a large chamber and positions the specimen holder outside of the fully enclosed working area, allowing larger specimens to be imaged. The chamber also provides a low initial sample pressure, so as to minimize movement of fragile, nanoscale samples. FEI Nova is capable of imaging specimens over a wide range of magnifications, up to a maximum of 30,000x. It is also equipped with an automated aligned objective lens, which ensures that the image quality is of the highest standard at all magnifications. FEI Nova has a built-in digital signal processor, which is capable of processing image data at rates of up to 500 frames per second for ultra-high-speed imaging. FEI Nova is equipped with a secondary electron detector, which not only allows for high-resolution images, but also provides the user with elemental mapping capabilities. This allows for the analysis of the composition of the specimen, as well as its localization in three dimensions. The microscope is also equipped with an automated column control system, which ensures precise adjustments of the height, tilt, and rotation of the column during imaging. The Nova NanoSEM is capable of generating images of specimens with a fine resolution of 0.05nm, allowing users to observe features and fine structures previously too small to be seen. With its automatic feature recognition, FEI Nova has the ability to detect features on the specimen and quickly bring these features into focus without the use of manual adjustment. All of these features make FEI Nova NanoSEM an extremely powerful and user-friendly scanning electron microscope.