Used FEI Nova NanoSEM 230 #9074929 for sale
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ID: 9074929
Vintage: 2008
EDS Electron microscope
EDAX Detector unit, model: PV7760/68 ME
Immersion lens or through the lens detector
X-ray detector for EDS semi-quant work
Magnification: 100,000 X
Field emission electron source
Probe current: 10 nA, 22 nA
Beam acceleration voltage: 200 V to 30,000 V
Includes beam deceleration option
Beam impact energy minimal: 50 V
(6) Electron image signal detectors:
In-lens secondary electron detector , (TLD-SE)
In-lens BSE detector, (TLD-BSE)
Everhart - Thornley detector, (ETD)
Solid state scanning transmitted electron detector, (STEM)
Gaseous analytical detector, (GAD)
Low vacuum secondary electron detector, (LVD)
low kV backscattered electron detector: available, but not in use yet
Resolution at optimum working distance:
1.0 nm at 15 kV : TLD-SE
1.6 nm at 1 kV : TLD-SE
0.8 nm at 30 kV : STEM
Also includes:
Motorized 4 axis stage
X-ray energy dispersive spectrometer, (EDS)
Microscope
Microscope PC with monitor
Support PC with monitor
DV14PRO Switch
Edwards vacuum scroll pump
Electronic console
Haskris air cooled water chiller
Jun Aire compressor
Table
Pumps and electrical lines
Software and installation CDs
Tool box with spare parts
Currently installed.
FEI Nova NanoSEM 230 is a scanning electron microscope (SEM) with superior performance and unsurpassed imaging quality. It utilizes a high-energy electron detector as well as a field emission gun to achieve high-resolution images and provide unparalleled detail of samples. Moreover, the advanced 2nd and 3rd generation imaging technology of the NanoSEM 230 features variable beam current and acceleration voltage, and extended low-dose capabilities for superior imaging results. The NanoSEM 230 has a large chamber for accommodating samples, with a 0.8 m work distance that allows for easy positioning and manipulations. Its low-vibration design features improved stability and scanning sensitivity, enhancing imaging performance. To further enhance imaging, the SEM comes with a FlexSEM pivoting detector arm, allowing for a variety of angles of view. The pivoting arm also allows for greater flexibility when switching between imaging and analysis modes. Nova NanoSEM 230 features a sophisticated software platform, integrating all SEM functions into one easy to use the interface. The advanced functions of the software control the SEM's parameters for optimizing sample analysis and image acquisition. Furthermore, the software includes sophisticated image processing, surface analysis, and overlay capabilities. These features allow scientists to preview how changes to analysis parameters will affect imaging results before the actual experiment or determine the exact composition of a sample, providing unparalleled accuracy and precision. The NanoSEM 230 is built to last, offering superior performance with long-term reliability. Its advanced design minimizes vibration for improved imaging and reduces the need for regular maintenance. Thanks to its intuitive user interface, its easy for users to quickly master the instrument and its functions. The superior performance and accuracy of FEI Nova NanoSEM 230 make it a powerful tool for scientists interested in producing detailed analysis results and accurate images. The SEM's advanced system and software feature increased flexibility and accuracy, making the NanoSEM 230 an ideal choice for a variety of applications.
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