Used FEI Nova NanoSEM 230 #9150375 for sale
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ID: 9150375
Vintage: 2010
Scanning electron microscope (SEM)
Retractable low-kV high-contrast detector
Through lens detector
Backscatter detector
SED
Auto stage
Chamber CCD
Ion coater
Dry scroll pump
UPS System
6-Channel detector amplifier
(20) Specimen stubs for SEMs
Thermal printer kit
LCD Monitor, 19"
Manual user interface
Acoustic enclosure for pre-vacuum pump
5-Axes motorized stage (field upgrade)
Optic
Gun: SE-cathode electron gun
Pump: (2) Ion pumps
Aperture: Multiple hole aperture
Detector:
SED
GBSD
BSD
RBSD
CCD: IR CCD Camera
Chamber
Stage:
X, Y, Z, R Axis motor drive
Tilt: Manual
Chamber: Std XL 30 chamber
Pump: Turbo pump
Air anti vibration system
Control system
PC:
Microscope control PC (HP XW4800T)
Support PC (HP XW4800T)
LCD, 19"
ETC:
Microscope control PAD for FEI
Keyboard
Mouse
Switching box for Keyboard and Mouse
MITSUBISHI Video printer - P93D
Power rack
PCB: 30KV HT unit
Pump:
EDWARDS XDS10 scroll pump
Diaphragm pump: SINKU KIKO DA-60D
2010 vintage.
FEI Nova NanoSEM 230 is an advanced scanning electron microscope designed to produce high resolution images of materials down to a nanoscale level. This ultra-high resolution instrument uses electron beams to scan and generate detailed images of samples, making it a powerful tool for analysis and observation of a variety of materials and nanostructures. The NanoSEM 230 offers a range of electron beam energies, ranging from 2 keV to 30 keV, with a beam spot size still smaller than 10 nm when operating at 40 kV. This resolution is suitable for the characterization of small structures and nanomaterials. The system is equipped with a set of state-of-the-art detectors, enabling simultaneous detection of secondary electrons, backscattered electrons, and transmitted electrons. This allows the user to view the sample from many different directions, creating a much clearer image. The high-resolution images provided by Nova NanoSEM 230 are useful for many applications, such as imaging magnetic structures, studying conductance in nanowires, measuring electrical properties of thin films, characterizing micro- and nanostructures, and viewing the structure of amorphous materials at the nanoscale. The electron beam can also be used to perform imaging, etching, and deposition. Additionally, the dual beam facility allows for three-dimensional imaging of the sample. The instrument is equipped with an automatic temperature and humidity control system and with a turbo-pump to reduce the operational chamber pressure and minimize the effects of gas molecules between the specimen and electron detector. The NanoSEM 230 is operated from a Windows 10 touchscreen user interface, allowing the user to easily control the instrument and access saved data. FEI Nova NanoSEM 230 is a powerful scanning electron instrument ideally suited for analysis of nanomaterials and imaging of nanostructures. With its ultra-high resolution capabilities, state-of-the-art detectors, and wide range of beam energies, the NanoSEM 230 provides invaluable images of materials at the nanoscale.
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