Used FEI Nova NanoSEM 230 #9150375 for sale

It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.

ID: 9150375
Vintage: 2010
Scanning electron microscope (SEM) Retractable low-kV high-contrast detector Through lens detector Backscatter detector SED Auto stage Chamber CCD Ion coater Dry scroll pump UPS System 6-Channel detector amplifier (20) Specimen stubs for SEMs Thermal printer kit LCD Monitor, 19" Manual user interface Acoustic enclosure for pre-vacuum pump 5-Axes motorized stage (field upgrade) Optic Gun: SE-cathode electron gun Pump: (2) Ion pumps Aperture: Multiple hole aperture Detector: SED GBSD BSD RBSD CCD: IR CCD Camera Chamber Stage: X, Y, Z, R Axis motor drive Tilt: Manual Chamber: Std XL 30 chamber Pump: Turbo pump Air anti vibration system Control system PC: Microscope control PC (HP XW4800T) Support PC (HP XW4800T) LCD, 19" ETC: Microscope control PAD for FEI Keyboard Mouse Switching box for Keyboard and Mouse MITSUBISHI Video printer - P93D Power rack PCB: 30KV HT unit Pump: EDWARDS XDS10 scroll pump Diaphragm pump: SINKU KIKO DA-60D 2010 vintage.
FEI Nova NanoSEM 230 is an advanced scanning electron microscope designed to produce high resolution images of materials down to a nanoscale level. This ultra-high resolution instrument uses electron beams to scan and generate detailed images of samples, making it a powerful tool for analysis and observation of a variety of materials and nanostructures. The NanoSEM 230 offers a range of electron beam energies, ranging from 2 keV to 30 keV, with a beam spot size still smaller than 10 nm when operating at 40 kV. This resolution is suitable for the characterization of small structures and nanomaterials. The system is equipped with a set of state-of-the-art detectors, enabling simultaneous detection of secondary electrons, backscattered electrons, and transmitted electrons. This allows the user to view the sample from many different directions, creating a much clearer image. The high-resolution images provided by Nova NanoSEM 230 are useful for many applications, such as imaging magnetic structures, studying conductance in nanowires, measuring electrical properties of thin films, characterizing micro- and nanostructures, and viewing the structure of amorphous materials at the nanoscale. The electron beam can also be used to perform imaging, etching, and deposition. Additionally, the dual beam facility allows for three-dimensional imaging of the sample. The instrument is equipped with an automatic temperature and humidity control system and with a turbo-pump to reduce the operational chamber pressure and minimize the effects of gas molecules between the specimen and electron detector. The NanoSEM 230 is operated from a Windows 10 touchscreen user interface, allowing the user to easily control the instrument and access saved data. FEI Nova NanoSEM 230 is a powerful scanning electron instrument ideally suited for analysis of nanomaterials and imaging of nanostructures. With its ultra-high resolution capabilities, state-of-the-art detectors, and wide range of beam energies, the NanoSEM 230 provides invaluable images of materials at the nanoscale.
There are no reviews yet