Used FEI Nova NanoSEM 400 #9282097 for sale

FEI Nova NanoSEM 400 scanning electron microscope (SEM) is one of the most advanced instruments in its class, providing nanoscale resolution imaging of materials for quality control and research purposes. This SEM utilizes a high-resolution electron detector that captures high-resolution images of specimens in a variety of materials, including metals, polymers, composites, wood composites, and semiconductors. The images it yields are up to ten times brighter than traditional imaging methods and can magnify samples up to 400,000 times their original size. Nova NanoSEM 400 has a wide range of features which enable it to deliver high quality images. The high-termolecular-weight lens offers magnificent image quality over a wide range of magnifications. Its low-vibration motorized stage enables users to make fast and accurate movements in order to accurately take measurements or to map out features in a sample. Furthermore, FEI Nova NanoSEM 400 allows for easy navigation through detailed sample images through its automated navigation feature which automatically guides the electron beam over the entire sample in a few seconds. This scanning electron microscope is also equipped with an energy-dispersive X-ray detector which enables the analysis of elemental composition within the sample. This system is ideal for analyzing the segregation of alloys and the concentration of specific elements, as well as measuring the ratio of different elements in the sample. Additionally, the NanoSEM 400 includes a hyper-spectral imaging system which allows researchers to simultaneously capture a variety of images from multiple wavelengths and get a holistic view of the sample. Nova NanoSEM 400 offers versatile sample analysis. It is capable of producing 2D and 3D images with resolutions as low as 4nm. It is also suitable for imaging non-conductive materials such as biological samples, geological samples, and minerals. It can even be used to measure the deformation of materials, such as nucleation and growth of new features due to mechanical stress. Overall, FEI Nova NanoSEM 400 is an extremely powerful and precise tool, offering performance far beyond that of traditional imaging techniques. It is perfect for a variety of automated analysis and inspection applications in research and quality control settings.