Used FEI Nova NanoSEM 400 #9284372 for sale

FEI Nova NanoSEM 400 is a next-generation scanning electron microscope (SEM) designed to accommodate the most advanced in nano scale imaging requirements. With its high resolution imaging capabilities of up to 0.8nm, the NanoSEM 400 is the ideal tool for applications such as failure analysis, circuit scanning, defect identification, and visualizing surface topography. The microscope's high resolution imaging is thanks to its field emission gun (FEG) electron sources, which produce an extremely focused and high-brightness beam of electrons. This allows the NanoSEM 400 to scan and image sample surfaces at a lower magnification than other SEM systems, allowing for better resolution and greater accuracy. Furthermore, the FEG electron sources provide improved precision and imaging stability. Nova NanoSEM 400 has a range of advanced imaging capabilities, such as variable-pressure environmental scanning electron microscopy (ESEM), low vacuum scanning, secondary-electron imaging (SEI), and backscatter electron imaging (BSEI). ESEM enables users to analyze non-conductive samples without the need for any coating or high vacuum, making it ideal for applications in the life sciences and forensics. SEI and BSEI allow for the observation of both sample topography and chemistry, making it possible to obtain a detailed and comprehensive image of the sample. FEI Nova NanoSEM 400 is also capable of automated and motorized stage control, allowing for automated wafer scanning over large areas. This makes it possible to provide highly detailed images for large and complex samples, such as integrated circuits and MEMS devices. For further convenience, the system is also capable of remote operation via the internet, allowing for easier maintenance and support. Nova NanoSEM 400 is an advanced yet user friendly system that can easily be integrated into virtually any laboratory environment. With its high resolution imaging capabilities and comprehensive imaging options, FEI Nova NanoSEM 400 is the ideal tool to tackle the most intricate nano-scale imaging requirements.