Used FEI Nova NanoSEM 450 #293809852 for sale

FEI Nova NanoSEM 450
ID: 293809852
Scanning Electron Microscope (SEM) Resolution: High vacuum imaging, optimum WD 0.8 nm at 30 kV (STEM) 1.0 nm at 15 kV (TLD-SE) 1.4 nm at 1 kV (TLD-SE) without beam deceleration 3.5 nm at 100 V (DBS) High vacuum analysis, analytical WD 3.0 nm at 15 kV and 5 nA (TLD-SE) Low vacuum imaging, optimum WD 1.5 nm at 10 kV (Helix detector) 1.8 nm at 3 kV (Helix detector) Detectors: In-lens SE Detector (TLD-SE) In-lens BSE Detector (TLD-BSE) Everhardt-Thornley SED Low vacuum SED (LVD) IR-CCD High sensitivity low kV Directional Backscattered Detector (DBS), Lens-mount TV-Rate low vacuum solid-state BSED (GAD) Stage: Type: Eucentric goniometer stage, 5-axes motorised XY: 110x110mm DC motors Repeatability inf 2.0 µm (at0° tilt) Z: 25 mm R: nx360° Tilt: -15°/+75° Analytical working distance: 5 mm Accessories: GIS Carbon GIS Platinum Plasma cleaner PC Support User manual interface.
FEI Nova NanoSEM 450 is a scanning electron microscope (SEM) used for high resolution imaging and analysis of the micro and nanoscale. This state-of-the-art equipment features a superconduction-cooled field emission electron gun, a high speed deflector, and an ultrahigh resolution detector for unsurpassed imaging performance. The technology utilizes an ultra high vacuum equipment to allow for a greater space to be filled with electrons between columns, resulting in higher resolution and improved quality of images. This helps to reduce image blur and delete noise in the imaging results. In addition, the low electron beam energy dissipates quickly before it can cause damage to the specimen. The source's high brightness and small spot size enable resolution up to 1nm, meaning that smaller regions of a sample can be seen. With greater resolution than anyone ever before, Nova NanoSEM 450 can discern more detail in a sample than ever before. The user-friendly interface on the SE, featuring the latest Windows operating system, makes data processing fast and efficient. All components in the unit are integrated so users can quickly make adjustments to their settings and tools. The detector machine on FEI Nova NanoSEM 450 offers an enhanced intellectual imaging tool for detailed analysis. This allows for multiple signals to be collected including secondary and backscattered electrons as well as other signals. The detector asset also eliminates most signals that may interfere with the imaging process. Many other features such as automated sample stage, motorized lens movement, automated calibration procedures, specimen heating and cooling, and integrated e-beam writing capability go hand in hand with Nova NanoSEM 450 to provide the highest quality data collection for a scanning electron microscope. With its intuitive software and superior imaging resolution, FEI NanoSEM 450 is one of the best scanning electron microscopes available today.
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