Used FEI Nova NanoSEM 450 #9070198 for sale
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ID: 9070198
FE-SEM
Manual user interface
Support computer
Helix detector
Retractable STEM detector (STEMIII)
DBS detector retractable
GAD low-kV SSBSED
6-Channel detector amplifier
Quick loader
STEM III quickloader adaption; pre-tilted holder
Plasma cleaner
CryCleaner EC
Nav-Cam
SIS Scandium imagine software
(4) SIS Scandium desktop license
SIS Scandium solution height
Network dongle licences 50
Correlative navigation
4" Wafer holder
6" Wafer holder BON
UMB Specimen holder kit
Acoustic enclosure for prevacuum pump
50-pin electrical feedthrough
7-pin Coax electrical feedthrough
TEAM integration kit
(4) Thermoflex Chiller, 50Hz.
FEI Nova NanoSEM 450 is a scanning electron microscope (SEM) used for high resolution imaging and analysis of the micro and nanoscale. This state-of-the-art equipment features a superconduction-cooled field emission electron gun, a high speed deflector, and an ultrahigh resolution detector for unsurpassed imaging performance. The technology utilizes an ultra high vacuum equipment to allow for a greater space to be filled with electrons between columns, resulting in higher resolution and improved quality of images. This helps to reduce image blur and delete noise in the imaging results. In addition, the low electron beam energy dissipates quickly before it can cause damage to the specimen. The source's high brightness and small spot size enable resolution up to 1nm, meaning that smaller regions of a sample can be seen. With greater resolution than anyone ever before, Nova NanoSEM 450 can discern more detail in a sample than ever before. The user-friendly interface on the SE, featuring the latest Windows operating system, makes data processing fast and efficient. All components in the unit are integrated so users can quickly make adjustments to their settings and tools. The detector machine on FEI Nova NanoSEM 450 offers an enhanced intellectual imaging tool for detailed analysis. This allows for multiple signals to be collected including secondary and backscattered electrons as well as other signals. The detector asset also eliminates most signals that may interfere with the imaging process. Many other features such as automated sample stage, motorized lens movement, automated calibration procedures, specimen heating and cooling, and integrated e-beam writing capability go hand in hand with Nova NanoSEM 450 to provide the highest quality data collection for a scanning electron microscope. With its intuitive software and superior imaging resolution, FEI NanoSEM 450 is one of the best scanning electron microscopes available today.
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