Used FEI Nova NanoSEM 600 #293807963 for sale

FEI Nova NanoSEM 600 is an advanced scanning electron microscope designed to provide users with precise research data on nanoscale samples. It offers a wide range of tools and capabilities to aid in high-resolution imaging and characterization of an array of materials. The equipment is fully automated and easy to use, making it a great choice for advanced research tasks. Nova NanoSEM 600 utilizes a monochromatic electron source to provide users with high-resolution imaging and characterization. It supports a wide range of accelerating voltages, from 0.1 to 12 kV, and multiple imaging modes, including secondary electron, backscattered electron, and characteristic x-ray imaging. It supports pulse-burst signals for automated imaging with advanced feature detection, and "electronomap" image seqeunces for fully automated area mapping. The system also offers several tools and techniques for advanced research. It includes a peltier-cooled sample stage with a temperature range of -25 to 100 degrees Celsius, an immersed objective lens for up to ~300X magnification, an automated tilt stage, an automated blemish detector, an in-vacuum sample characterization unit for elemental mapping, and nano-tomography. Additionally, the machine supports automated drift-corrected imaging and contextually intellignt analysis with "electron-eye" automated functionality. For precise sample manipulation, FEI Nova NanoSEM 600 features a 4-axis motorized sample stage, which provides sub-micron accuracy in feature detection, positioning, and motion. The tool also includes automated vacuuming and pressure control, a range of in-vacuum accessories, and embedded software for end-to-end automation. With its comprehensive set of tools and highly advanced imaging and characterization capabilities, Nova NanoSEM 600 provides users with the ultimate solution for nanoscale research. It enables users to explore the nanoworld with extreme precision and accuracy, allowing them to gain an unparalleled understanding of their samples.