Used FEI Nova NanoSEM 600 #9379575 for sale

FEI Nova NanoSEM 600 is a high-end scanning electron microscope (SEM) that can scan the surface of samples with sub-nanometer resolution. It utilizes a field emission gun (FEG) electron source to deliver very high resolution images with a sub-angstrom level of accuracy. The FEG source gives the NanoSEM 600 increased sensitivity by providing high accelerating voltages, which also improve spatial resolution. The NanoSEM 600 also features a new dual beam setup that incorporates both SEM and Focused Ion Beam (FIB) capabilities. This allows the instrument to combine optical and surface imaging into a single system, making it the only dual-beam in its' class. The beam current for the SEM component is rated up to 10nA at 0.3 kV, allowing for a variety of imaging options. The NanoSEM 600 has an automated stageless navigation that aids useability by allowing the user to navigate quickly to the area of interest - sending images of adjacent locations in the field of view as it goes. This allows the user to establish a broad overview of the sample before zooming in to accurately focus on the details. The instrument features a sample manipulation system with two movable stages, enabling the imaging of samples with a wide variety of sizes. Rotation of the sample also occurs through the stages, providing multiple angle imaging with a resolution as high as 0.6nm. The NanoSEM 600 also incorporates an Energy Dispersive X-Ray Spectrometer (EDS) - providing the user with elemental mapping and chemical analysis. This helps to refine large scale elemental data, plus provides information on the samples topography and morphology. The instrument is hosted in a console computer, connected to any USB mouse or keyboard. The FeixRay plasma assist gas delivery system can help to achieve higher image resolution and accuracy. All of these features combine to create a powerful and reliable SEM that delivers industry leading resolution and accuracy.